Showing results: 46 - 51 of 51 items found.
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ScanExpress JTAG Debugger -
Corelis, Inc.
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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The Test Connection, Inc.
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Test Coach Corporation
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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ScanExpress TPG -
Corelis, Inc.
To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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TetraTek Products, Inc.
World-class integration of electronic test equipment, instrumentation, test fixtures, automation, load simulation,data acquisition, and software . In partnership with two major leaders in high-technology automation, three very capable machine shops, a custom cabling company, a rapid prototype circuit board fabrication house and two large automated sheet metal manufacturing facilities we offer custom process and test equipment designed and manufactured for convenience and precision. Each component of our systems is carefully consideredto provide you with maximum performance consistent with easy maintainability and long term return on your investment.
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Microchip Technology Inc.
Create complete systems while streamlining your development process and reducing your design risk. We design our mixed-signal, linear, interface and power products for seamless integration with our extensive portfolio of microcontrollers, digital signal controllers, microprocessors and FPGAs. Well-known for our thorough documentation, we provide parts that work on the bench the same way they’re described on paper. We also provide evaluation boards to demonstrate functionality, an intuitive Integrated Development Environment (IDE), simulation software and other design resources to create a rapid design, prototype and test environment for all aspects of your system design.
